Camtek, Raytek to jointly develop wafer AOI system

Camtek Ltd. (Nasdaq: CAMT; TASE:CAMT) and Raytex Corporation (TSE: 6672) will jointly develop, produce and market a system for automated optical inspection of semiconductor wafers along their production flow. The new system will combine Raytex's wafer edge and backside metrology and inspection capabilities with Camtek's surface inspection technologies. The integrated system will deliver comprehensive inspection for the complete wafer in a stand-alone, high productivity tool, for the most advanced wafer fabrication facilities.

The companies expect to begin deliveries of the new system in the second half of 2009.

Camtek's CEO Rafi Amit said, "Raytex is a leading supplier of high performance edge and backside metrology and inspection systems. Engineering teams from both companies will begin working together in the next few weeks to create a seamless integration of respective technologies."

Camtek's share was unchanged at $0.44 on Nasdaq yesterday and at NIS 1.79 on the TASE this morning.

Published by Globes [online], Israel business news - www.globes-online.com - on December 2, 2008